Temperature and electric field characteristics of time-dependent dielectric breakdown for silicon dioxide and reoxidized-nitrided oxides

✍ Scribed by Chi-Hung Lin; Cable, J.; Woo, C.S.

• Book ID: 114536117
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 421 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.391216