CโAFM and XโTEM : Studies of Mixed-Phase
โ
Tomรกลก Mates; Antonรญn Fejfar; Bohuslav Rezek; Jan Koฤka; Paula C. P. Bronsveld; J
๐
Article
๐
2008
๐
Wiley (John Wiley & Sons)
โ 570 KB
Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques. The conductive atomic force microscopy was performed in standard ambient conditions with very sensitive (pA) current detection. The cross-sectional tr