Tellurium in silicon Part I: Channeling and Rutherford backscattering studies of tellurium implanted silicon: G J Kemerink, et al, Rad Effects, 69 (1/2), 1983, 83–99

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 145 KB
• Volume: 35
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(85)90467-1