๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Technology for enameling of household gas and electrical applicances (Review)

โœ Scribed by V. Ya. Ioffe

Book ID
104885940
Publisher
Springer US
Year
1993
Tongue
English
Weight
368 KB
Volume
50
Category
Article
ISSN
0361-7610

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The effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications are studied. Under a fixed square number, the peak current density (J peak ) is increased with decreasing the polysilicon resistor width W . The time-to-fail value of the polysilicon resistor i