The heat accumulated in live integrated circuits is becoming more difficult to manage as transistor densities continue to increase at very rapid rates. Two non-invasive thermographic techniques are developed to seek out these thermally active sites which are highly susceptible to failure. One method
✦ LIBER ✦
Technological Incompatibility, Endogenous Switching Costs and Lock-in
✍ Scribed by Begoña Garcia Mariñoso
- Book ID
- 108516331
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 166 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0022-1821
No coin nor oath required. For personal study only.
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