Lock On! : Low-cost Technologies Home In on Defect Sites in Microcircuits
✍ Scribed by Carlo Mar Blanca; Caesar Saloma; Vernon Julius Cemine; Godofredo Bautista Jr.; Bernardino Buenaobra; Serafin Delica; Edward Carlo Samson
- Book ID
- 102278201
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 2006
- Weight
- 399 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1439-4243
No coin nor oath required. For personal study only.
✦ Synopsis
The heat accumulated in live integrated circuits is becoming more difficult to manage as transistor densities continue to increase at very rapid rates. Two non-invasive thermographic techniques are developed to seek out these thermally active sites which are highly susceptible to failure. One method utilises a simple optical feedback microscope to generate thermal maps based on the measured photo-induced current, while the second protocol probes thermally-induced changes on the spectral reflectance to localise active regions on the sample. These "hotspots" provide the best starting points for an efficient and accurate failure analysis paradigm.