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TCAD-based analysis of radiation-hardness in silicon detectors

✍ Scribed by Passeri, D.; Baroncini, M.; Ciampolini, P.; Bilei, G.M.; Santocchia, A.; Checcucci, B.; Fiandrini, E.

Book ID: 121800707
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 807 KB
Volume: 45
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.682456

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