## Abstract The meaning of attenuation length (AL) of x‐ray photoelectrons (and Auger electrons) in solids is reviewed in the light of new evidence pointing to strong dependences of AL on take‐off angle and film thickness, which can be traced back to elastic scattering. Since signal attenuation in
Take-off angle dependence of secondary ion signal intensity
✍ Scribed by V Fesič; M Veselý
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 107 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0042-207X
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