T-x frequency filtering of high resolution seismic reflection data using singular spectral analysis

High-resolution strain mapping in bulk s

High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

✍ A. Steuwer; J.R. Santisteban; M. Turski; P.J. Withers; T. Buslaps 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 257 KB

The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. A