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Systematic analysis of phosphor degradation under cathode-ray excitation

✍ Scribed by D.B.M. Klaassen; D.M. de Leeuw; T. Welker

Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
151 KB
Volume
31-32
Category
Article
ISSN
0022-2313

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The light emission performance of the X-ray excited CsI:Tl single-crystal scintillator was investigated as a function of X-ray tube voltage and crystal thickness. Four CsI:Tl single-crystal layers (CRYOS Ltd., Ukraine) with thickness from 1 to 7 mm were irradiated employing two X-ray tube voltage ra