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๐Ÿ“

System-level Test and Validation of Hardware/Software Systems

โœ Scribed by Z. Peng, M. Sonza Reorda, M. Violante (auth.), Professor Matteo Sonza Reorda, Professor Zebo Peng, Dr. Massimo Violante (eds.)


Publisher
Springer-Verlag London
Year
2005
Tongue
English
Leaves
186
Series
Springer Series in Advanced Microelectronics 17
Edition
1
Category
Library

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โœฆ Synopsis


New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.

As well as giving rise to new design practices, SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the necessary infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction such as higher functional performance and greater operating speed. Research efforts are already addressing this issue.

System-level Test and Validation of Hardware/Software Systems provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:

โ€ข modeling of bugs and defects;

โ€ข stimulus generation for validation and test purposes (including timing errors;

โ€ข design for testability.

For researchers working on system-level validation and testing, for tool vendors involved in developing hardware-software co-design tools and for graduate students working in embedded systems and SOC design and implementation, System-level Test and Validation of Hardware/Software Systems will be an invaluable source of reference.

โœฆ Table of Contents


Introduction....Pages 1-3
Modeling Permanent Faults....Pages 5-25
Test Generation: A Symbolic Approach....Pages 27-46
Test Generation: A Heuristic Approach....Pages 47-65
Test Generation: A Hierarchical Approach....Pages 67-81
Test Program Generation from High-level Microprocessor Descriptions....Pages 83-106
Tackling Concurrency and Timing Problems....Pages 107-120
An Approach to System-level Design for Test....Pages 121-149
System-level Dependability Analysis....Pages 151-174

โœฆ Subjects


Circuits and Systems; Electronics and Microelectronics, Instrumentation; Engineering Design; Computer Hardware; Programming Techniques; Condensed Matter


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