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System for recording and analysis of reflection high-energy electron diffraction patterns

✍ Scribed by G. M. Gur’yanov; V. N. Demidov; N. P. Korneeva; V. N. Petrov; Yu. B. Samsonenko; G. É. Tsyrlin


Book ID
110120639
Publisher
Springer
Year
1997
Tongue
English
Weight
71 KB
Volume
42
Category
Article
ISSN
1063-7842

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A three-dimensional analysis in reciprocal space is used to analyse reflection high energy electron diffraction (RHEED) patterns. Particular emphasis is placed on investigating the surface resonance phenomenon, the resonance conditions, and the diffraction mechanisms. The surface resonance regions d