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Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

✍ Scribed by S.Y. Tong; T.C. Zhao; H.C. Poon; K.D. Jamison; D.N. Zhou; P.I. Cohen

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 289 KB
Volume: 128
Category: Article
ISSN: 0375-9601
DOI: 10.1016/0375-9601(88)90128-4

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