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System for measuring optical admittance of a thin film stack

✍ Scribed by Sheng-Hui Chen; Kai Wu; Chien-Cheng Kuo; Sheng-Ju Ma; Cheng-Chung Lee

Publisher: Optical Society of Japan
Year: 2009
Tongue: English
Weight: 207 KB
Volume: 16
Category: Article
ISSN: 1340-6000
DOI: 10.1007/s10043-009-0093-5

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