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Optical measurement for thin films of Bi-Sr-Ca-Cu-O systems

✍ Scribed by K. Hirochi; K. Setsune; S. Hayashi; K. Mizuno; T. Matsushima; Y. Ichikawa; H. Adachi; K. Wasa

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 350 KB
Volume: 165-166
Category: Article
ISSN: 0921-4526
DOI: 10.1016/s0921-4526(09)80213-5

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✦ Synopsis

The normal state optical properties of the Bi2Sr2Can-ICunOx systems have been measured using thin films with highly oriented c-axis normal to (100) MgO substrates. For the films defined by n=l, 2 and 3, a Drude like plasma reflection was recognized on the reflectivity spectra. With increasing n, the plasma reflection became clearer and a plasma edge shifted to the higher energy side.

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