Synthesis, Crystal Growth and Characterization

✍ Scribed by K. Lal (Eds.)

• Year: 1982
• Tongue: English
• Leaves: 565
• Category: Library

✦ Table of Contents

Content:
FRONT MATTER, Page i
Copyright, Page ii
DR. AJIT RAM VERMA, Pages iii-iv
SPONSORING ORGANISATIONS, Pages v-vi
FOREWORD, Pages ix-x, Emmanuel Kaldis
PREFACE, Pages xi-xii, Krishan Lal
CRYSTAL GROWTH AND LATTICE IMPERFECTIONS–INTERFEROMETRIC AND X-RAY DIFFRACTION STUDIES: REMINISCENCES, Pages 1-56, AJIT RAM VERMA
HIGH-TEMPERATURE CRYSTAL GROWTH AND THERMODYNAMIC CHARACTERIZATION OF MATERIALS WITH VALENCE INSTABILITIES, Pages 57-85, E. KALDIS, B. FRITZLER, H. SPYCHIGER, B. STEINMANN
MICROCRYSTALLINE AND AMORPHOUS SILICON PREPARED BY LOW PRESSURE PLASMA CVD, Pages 87-92, Z. IQBAL
CRYSTALLIZATION OF ELECTRONIC MATERIALS UNDER VERY HIGH GAS PRESSURES, Pages 93-117, SŁAWOMIR MAJOROWSKI
FUNDAMENTAL ASPECTS OF CRYSTAL GROWTH AND EPITAXY (in-situ STUDIES), Pages 119-134, R. KERN
FUNDAMENTAL ASPECTS AND TECHNIQUES OF CRYSTAL GROWTH FROM THE MELT, Pages 135-183, CARLO PAORICI
HIGH-TEMPERATURE NON-METALLIC CRYSTALLINE MATERIALS, Pages 185-195, V.V. OSIKO
CRYSTAL GROWTH AND EPITAXY FROM HIGH-TEMPERATURE SOLUTIONS, Pages 197-211, W. TOLKSDORF
CHARACTERISATION OF CRYSTAL PERFECTION BY DIFFRACTION METHODS, Pages 213-214, NORIO KATO
AN INTRODUCTION TO THE EXPERIMENTAL TECHNIQUES USED IN X-RAY DIFFRACTION TOPOGRAPHY, Pages 215-241, KRISHAN LAL
X-RAY DIFFRACTION MEASUREMENT OF STRAINS AND STRESSES IN THIN FILMS, Pages 243-259, ARMIN SEGMÜLLER
X-RAY DIFFRACTION STUDY OF PERIODIC AND RANDOM FAULTING IN CLOSE-PACKED STRUCTURES, Pages 261-285, DHANANJAI PANDEY, P. KRISHNA
CHARACTERIZATION OF POINT DEFECT AGGREGATES IN NEARLY PERFECT CRYSTALS BY DIFFUSE X-RAY SCATTERING MEASUREMENTS, Pages 287-315, KRISHAN LAL
ELECTRON SPECTROSCOPIC STUDIES OF SOLID SURFACES, Pages 317-338, C.N.R. RAO
DEFECT CHARACTERIZATION USING TRANSMISSION AND SCANNING ELECTRON MICROSCOPY, Pages 339-371, J. HEYDENREICH
THE STRUCTURE OF GRAIN BOUNDARIES, Pages 373-388, S. RANGANATHAN
STRUCTURE OF TIN OXIDE FILMS, Pages 389-397, S.K. PENEVA, D.D. NIHTIANOVA, R.K. RUDARSKA, K.D. DJUNEVA, I.Z. KOSTADINOV
CHARACTERISATION OF MATERIALS BY NEUTRON SCATTERING, Pages 399-412, R. CHIDAMBARAM, A. SEQUEIRA
CHARACTERISATION OF SEMICONDUCTORS BY ELECTRON TRANSPORT EXPERIMENTS, Pages 413-426, B.R. NAG
STRUCTURAL CHANGES IN CRYSTALS AT POWER DENSITIES NEAR THE ELECTRIC BREAKDOWN, Pages 427-438, PETER THOMA, KRISHAN LAL
PHYSICS IN MICROELECTRONICS AND MICROELECTRONICS IN PHYSICS, Pages 439-467, E. MOOSER
SOLAR CELLS, Pages 469-484, JOHN B. GOODENOUGH
SOLAR GENERATORS WITH CRYSTALLINE SILICON SOLAR CELLS, Pages 485-496, KURT ROY
IONIC CONDUCTORS: THE STRUCTURAL APPROACH, Pages 497-518, HEINZ SCHULZ
FAST ION TRANSPORT IN SOLIDS, Pages 519-553, JOHN B. GOODENOUGH
MODERN PHYSICS AND SYĀDVĀDA, Pages 555-568, D.S. KOTHARI