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Synthesis and transport properties of La2 − xSrxCuO4 thin films deposited by laser ablation

✍ Scribed by G.-C. Yi; W. Jo; Y.K. Kim; T.W. Noh; D.-K. Ko; H. Noh; Z.G. Khim


Book ID
108465576
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
544 KB
Volume
194
Category
Article
ISSN
0921-4534

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The growth characteristics of La 2\_xsr~cuO4 thin films of various thicknesses (10-150 nm), epitaxially grown by laser ablation on (100) SrTiO 3 substrates, were analysed by transmission electron microscopy (TEM) and atomic force microscopy (AFM). A periodic surface roughness with an important peak-