Structure and properties of CeN thin fil
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S.Q. Xiao; K. Tsuzuki; C.P. Lungu; O. Takai
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Article
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1998
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Elsevier Science
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English
โ 270 KB
CeN thin films were deposited at 573 K by reactive arc ion plating sustained by electron beam evaporation. Optical emission observation revealed that Ce vapor arc discharge in nitrogen atmosphere was very localized and the relative emission intensity of Ce + to atomic Ce was proportional to the arc