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Synchrotron X-ray diffraction and absorption studies of CeM2X2 (M=Cu, Ni and X=Si, Ge) at high pressure

✍ Scribed by S. Tsuduki; A. Onodera; K. Ishida; Y. Kitaoka; A. Onuki; N. Ishimatsu; O. Shimomura

Book ID: 108269459
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 170 KB
Volume: 134
Category: Article
ISSN: 0038-1098
DOI: 10.1016/j.ssc.2005.03.025

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