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EXAFS and X-ray diffraction of RM2X2 compounds (R = rare earths, M> = transition metal, X = Si, Ge)

✍ Scribed by C. Godart; C. Ammarguellat; M.F. Ravet; N. Wetta; C. Levy-Clement; H. Noel; G. Krill

Book ID: 107854948
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 288 KB
Volume: 59
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(86)90588-0

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