Run-to-run control charts with contrasts
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George C. Runger; John W. Fowler
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Article
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1998
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John Wiley and Sons
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English
β 258 KB
In semiconductor manufacturing it is useful to design control charts to be sensitive to anticipated assignable causes. Process knowledge can be used to develop summaries for run-to-run control that are more sensitive to problems than traditional approaches. As the number of measurements recorded fro