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Surface X-ray diffraction study on the Si(001)2 × 1 structure

✍ Scribed by M. Takahasi; S. Nakatani; Y. Ito; T. Takahashi; X.W. Zhang; M. Ando


Book ID
116067471
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
398 KB
Volume
338
Category
Article
ISSN
0039-6028

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