Asymmetric versus symmetric dimerization on the Si(001) and As/Si(001)2 × 1 reconstructed surfaces as observed by grazing incidence X-ray diffraction

✍ Scribed by N. Jedrecy; M. Sauvage-Simkin; R. Pinchaux; J. Massies; N. Greiser; V.H. Etgens

• Book ID: 118363247
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 687 KB
• Volume: 230
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(90)90027-6