Surface studies by crystal current measurement of X-ray induced secondary electron emission: I. Application to metal overlayer growth: Cu on Ni(100)

✍ Scribed by D. Chadwick; M.A. Karolewski; K. Senkiw

• Book ID: 118986719
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 309 KB
• Volume: 175
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(86)90003-8