Surface studies by crystal current measurement of X-ray induced secondary electron emission: I. Application to metal overlayer growth: Cu on Ni(100)

✍ Scribed by D Chadwick; M.A Karolewski; K Senkiw

• Publisher: Elsevier Science
• Year: 1986
• Weight: 222 KB
• Volume: 175
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(86)90332-4