## Abstract Static secondary ion mass spectroscopy (SSIMS) is applied to study the surface of the miscible polystyrene (PS)/poly(vinyl methyl ether) (PVME) blend. The blend surface is enriched with PVME and the enrichment is shown to depend on the composition and molecular weight of the blend const
β¦ LIBER β¦
Surface Segregation in Miscible Blends of Polystyrene and Poly(vinylmethyl ether): Comparison of Theory and Experiment
β Scribed by Christopher Forrey; Jeffrey T. Koberstein; David H. Pan
- Book ID
- 110415896
- Publisher
- Springer
- Year
- 2003
- Tongue
- English
- Weight
- 167 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0927-7056
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