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Static SIMS study of miscible blends of polystyrene and poly(vinyl methyl ether)

✍ Scribed by Qamar S. Bhatia; Michael C. Burrell


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
247 KB
Volume
15
Category
Article
ISSN
0142-2421

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✦ Synopsis


Abstract

Static secondary ion mass spectroscopy (SSIMS) is applied to study the surface of the miscible polystyrene (PS)/poly(vinyl methyl ether) (PVME) blend. The blend surface is enriched with PVME and the enrichment is shown to depend on the composition and molecular weight of the blend constituents. A semi‐quantitative analysis of SSIMS intensities to obtain surface compositions gives good qualitative agreement with previous x‐ray photoelectron spectroscopy (XPS) results.


πŸ“œ SIMILAR VOLUMES


Phase separation in miscible blends of p
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Polystyrene (PS) samples carrying terminal or in-chain nitroxide spin labels have been blended with poly(vinyl methyl ether) (PVME) in varying proportions and their electron spin resonance (ESR) spectra recorded over a range of temperatures. The spectra are mainly of the slow-motion type but reΓ‘ect

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This article presents thermal diffusivity ( D) measurements by flash radiometry for the polymer blend of polystyrene (PS) and poly(vinyl methyl ether) (PVME) with lower critical solution temperature (LCST) phase diagram. Dependence of D on PS content measured at 100ЊC coincides a phase diagram deter