Surface morphology and electrical transport properties of YBa2Cu3O7 films on substrates relevant for technical application
β Scribed by G. Adrian; G. Grabe; W. Wilkens; H. Adrian; M. Huth; A. Walkenhorst
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 413 KB
- Volume
- 185-189
- Category
- Article
- ISSN
- 0921-4534
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β¦ Synopsis
YBa2CuaOr films depositea on AlcOa by laser ablation show c-axis oriented growth and critical temperatures T~ as high as 90 K. However the critical curren ~. density J~ is comparatively low. An improvement was achieved by using a ZrO2 intermediate layer which acts as a diffusion harrier. Bilayer YBa2CuaOr/ZrO2 films prepared in-situ by laser ablation from a multi-target system under various conditions and with several buffer layer thicknesses exhibited J~-values up to 510 s A/cm ~ at 77 K. The structure and the surfaces of the films were characterised by x-ray diffraction and scanning electron microscopy, respectively. The critical current density was measured as function of temperature, external magnetic field B, and relative orientation between B and the film surfaces.
π SIMILAR VOLUMES
Thin YBa 2 Cu 3 O x (YBCO) films were deposited using DC-sputtering technique on NdGaO 3 substrates, tilted from (1 1 0) orientation by 0-26Β°. The structure and surface quality of the substrates were carefully characterized to obtain reliable results of thin films deposition. Structural, morphologic
YBazCuzOr films were deposited by inverted cylindrical magnetron sputtering on metallic substrates as e.g. Ni sheet covered with the natural oxide as barrier layer. These films grow c-axis oriented with a Tmn=0 of about 80 K. For a better understanding of the growth procedure oil metal oxides, thin