𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Surface Morphological Study of J-Aggregate Thin Films by Atomic Force Microscopy

✍ Scribed by Daehne, Lars; Tao, Jian; Mao, Guangzhao

Book ID
126979371
Publisher
American Chemical Society
Year
1998
Tongue
English
Weight
86 KB
Volume
14
Category
Article
ISSN
0743-7463

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Thin liquid films studied by atomic forc
Thin liquid films studied by atomic force microscopy
✍ Elmar Bonaccurso; Michael Kappl; Hans-JΓΌrgen Butt πŸ“‚ Article πŸ“… 2008 πŸ› Elsevier Science 🌐 English βš– 727 KB

Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investig