Surface oxide layers of Si and Ge nanocr
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S. Hayashi; S. Tanimoto; M. Fujii; K. Yamamoto
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Article
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1990
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Elsevier Science
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English
β 537 KB
Surface oxide layers for5ed on gas-evaporated Si and Ge microcrystals as small as 1OOA were investigated by means of infrared spectroscopy, high-resolution electron Ficroscopy and X-ray photoemission spectroscopy. It is shown that 20A-thick native oxide layers in the form of SiO, with x=-1.2 are fir