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Surface characterization of high-dose Sb+ implanted rapid thermal annealed monocrystalline silicon

โœ Scribed by S.N Kumar; G Chaussemy; M Charbonnier; B Canut; A Laugier; M Romand


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
464 KB
Volume
4
Category
Article
ISSN
0921-5107

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