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Thermal wave characterization of silicon which had been high energy ion implanted and furnace annealed

✍ Scribed by G.M. Crean; M.G. Somekh; S.J. Sheard; C.W. See


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
331 KB
Volume
2
Category
Article
ISSN
0921-5107

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