Surface breakdown in silicon planar junctions—A computer-aided experimental determination of the critical field

✍ Scribed by C. Bulucea; A. Rusu; C. Postolache

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 750 KB
• Volume: 17
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(74)90040-9