Surface breakdown in silicon planar junctions—a computer-aided experimental determination of the critical field : C. Bulucea, A. Rusu and C. Postolache. Solid State Electron.17, 881 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 134 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90637-x