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Surface-acoustic-wave film thickness monitor


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
158 KB
Volume
28
Category
Article
ISSN
0042-207X

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โœฆ Synopsis


resolved by taking into account the differences concerning the film orientations. (Germany)


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A modified technique for optical monitoring of the quarter-wave stacks of dielectric materials, utilising the principle of wavelength modulation and phase sensitive detection, is suggested. The accuracy and the sensitivity of the method is very high and can be used for making the coating process sel