Grain boundary strengthening of copper-b
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D. Lobemeier; H. Klein; E. Nembach
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Article
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1998
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Elsevier Science
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English
⚖ 156 KB
AbstractÐThe yield strength s y of copper-base copper±manganese and copper±gallium polycrystalline solid solutions has been measured as a function of the grain size d. X-ray diraction studies proved that the specimens had only very weak textures. The function s y (d) is well represented by the Hall±