Superconductivity of MgB2 sputtered thin films with aluminium nitride buffer layers
β Scribed by G. Ilonca; T.R. Yang; A.V. Pop; V. Toma; P. Balint; M. Bodea; D. Marconi; T. Jurcut
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 256 KB
- Volume
- 460-462
- Category
- Article
- ISSN
- 0921-4534
No coin nor oath required. For personal study only.
β¦ Synopsis
MgB 2 thin films were deposited, at low temperature substrates, in situ, on a polished c-cut sapphire substrates, with the aluminium nitride (AlN) buffer layers, using the multiple-target sputtering system. The magnetoresistivities were measured using dc-4 terminal method in applied magnetic field up to 9 Tesla. The upper critical field anisotropy, H c2 (T) and irreversibility field H irr (T) versus temperature were determinated. The Hall density of charge are slightly temperature dependence and positive in normal state. The critical temperature of 30-32 K and critical current density of 10 6 -10 7 A/cm 2 at 4, 2 K were obtained. Using extracted data, the coherence length n 0 , anisotropic coefficient c and penetration depth k L were calculated.
π SIMILAR VOLUMES
Superconductor MgB 2 thin films with thickness 200 nm were prepared on sapphire substrates by co-deposition of boron and magnesium. Precursor MgB thin films were deposited from two independent magnetron sources-boron by rf magnetron sputtering and magnesium by dc magnetron sputtering. MgB precursor
As-grown superconducting MgB 2 thin films were prepared by very simple RF sputtering method using a single target without post-annealing process. A two-component target comprising of many small chunks of B on a Mg disk was used. The films were deposited onto polished single crystal sapphire (R-plane