𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Superconductivity in boron-doped homoepitaxial (001)-oriented diamond layers

✍ Scribed by Kačmarčik, J. ;Marcenat, C. ;Cytermann, C. ;Ferreira da Silva, A. ;Ortega, L. ;Gustafsson, F. ;Marcus, J. ;Klein, T. ;Gheeraert, E. ;Bustarret, Etienne


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
245 KB
Volume
202
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

✦ Synopsis


Abstract

The crystallinity and built‐in strain of diamond epilayers grown by MPCVD with boron contents n~B~ varying from 2 × 10^20^ to 2 × 10^21^ cm^–3^ as evaluated by SIMS are assessed by HR‐XR Diffraction. Both ac transport and ac susceptibility measurements show that the critical concentration for the onset of superconductivity in (001)‐oriented single crystalline films is about 5 × 10^20^ cm^–3^. This is also the critical hole concentration for the metal–non metal transition in this system, as evaluated by two types of theoretical calculations and by low temperature resistivity experiments. We report also preliminary results of point contact spectroscopy on an epilayer with a critical transition temperature T~c~ = 2.1 K, which yield a superconducting gap around 0.3 meV compatible with a conventional BCS‐type description of superconductivity in this system. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)


📜 SIMILAR VOLUMES


Phosphorus incorporation and activity in
✍ Frangieh, G. ;Pinault, M.-A. ;Barjon, J. ;Tillocher, T. ;Jomard, F. ;Chevallier, 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 151 KB

## Abstract In this work, we present a study about the homoepitaxial growth of phosphorus‐doped diamond on (100) substrates. The growth was performed by microwave plasma assisted chemical vapor deposition (MPCVD) adding an organic precursor for phosphorus (tertiarybutylphosphine: TBP) in the gaseou

Effect of ECR etching conditions of (100
✍ Volpe, Pierre-Nicolas ;Muret, Pierre ;Omnes, Franck 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 673 KB

## Abstract The effect of oxygen electron cyclotron resonance (ECR) microwave plasma etching on the crystallinity of low boron doped thin diamond films grown on Ib (100)‐oriented diamond substrates by MPCVD has been investigated with respect to the main experimental conditions: microwave power and

Electrically active defects in boron dop
✍ Muret, Pierre ;Kumar, Amit ;Volpe, Pierre-Nicolas ;Wade, Mamadou ;Pernot, Julien 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 642 KB

## Abstract Homoepitaxial thin films of boron doped diamond are investigated with the help of Fourier transform deep level transient spectroscopy (FT‐DLTS) and high resolution isothermal transient spectroscopy (HR‐ITS) in order to determine the properties of hole traps. Conductivity studies and oth

Metal-insulator transition and supercond
✍ Achatz, P. ;Bustarret, E. ;Marcenat, C. ;Piquerel, R. ;Dubouchet, T. ;Chapelier, 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 777 KB

## Abstract The low temperature electronic transport of highly boron‐doped nanocrystalline diamond films is studied down to 300 mK. The films show superconducting properties with critical temperatures __T__~c~ up to 2.1 K. The metal–insulator and superconducting transitions are driven by the dopant

Deep levels in homoepitaxial boron-doped
✍ Muret, Pierre ;Pernot, Julien ;Teraji, Tokuyuki ;Ito, Toshimichi 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 341 KB

## Abstract Deep level transient spectroscopies (DLTS) applied to Schottky junctions made on homoepitaxial boron‐doped diamond films show the existence of two traps. A deep acceptor, negatively charged and strongly attractive for holes, 1.57 eV above the valence band edge displays the characteristi

Acceptor compensation by dislocations re
✍ Muret, P. ;Wade, M. 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 203 KB

## Abstract This document shows that new electrically active defects can develop in the homoepitaxial layer grown on Ib diamond substrates, related to the increase of the dislocation density. Deep centres, which are able to compensate the boron acceptors, specially when the growth process allows bo