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Sum rule for the transmission cross section of apertures in thin opaque screens

✍ Scribed by Gustafsson, Mats

Book ID: 115432021
Publisher: Optical Society of America
Year: 2009
Tongue: English
Weight: 230 KB
Volume: 34
Category: Article
ISSN: 0146-9592
DOI: 10.1364/OL.34.002003

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## Abstract A method is described for the preparation of cross‐sectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that