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Subwavelength depth resolution in near-field microscopy

✍ Scribed by Fischer, David G.


Book ID
115424383
Publisher
Optical Society of America
Year
2000
Tongue
English
Weight
93 KB
Volume
25
Category
Article
ISSN
0146-9592

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## Abstract We have analyzed Cu(InGa)Se~2~ thin films, fabricated by standard deposition technique for solar cells, by near‐field scanning optical microscopy (NSOM) which allows for simultaneous detection of photoluminescence (PL) and AFM‐like topography. In comparison with our former confocal micr