An extended subtraction method of scattering parameters for characterizing laser diode is proposed in this paper. The intrinsic response is extracted from the measured transmission coefficients of laser diode, and the parasitics of packaging network and laser chip are determined from the measured re
Subtraction of scattering parameters for adiabatic intrinsic responses of semiconductor lasers
β Scribed by S. J. Zhang; N. H. Zhu; Y. Liu; Y. Z. Liu
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 548 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0895-2477
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β¦ Synopsis
Abstract
Thermal effects will make chip temperature change with bias current of semiconductor lasers, which results in inaccurate intrinsic response by the conventional subtraction method. In this article, an extended subtraction method of scattering parameters for characterizing adiabatic responses of laser diode is proposed. The pulsed injection operation is used to determine the chip temperature of packaged semiconductor laser, and an optimal injection condition is obtained by investigating the dependence of the lasing wavelength on the width and period of the injection pulse in a relatively wide temperature range. In this case, the scattering parameters of laser diode are measured on adiabatic condition and the adiabatic intrinsic responses of packaged laser diode are first extracted. It is found that the adiabatic intrinsic responses are evidently superior to those without thermal consideration. The analysis results indicate that inclusion of thermal effects is necessary to acquire accurate intrinsic responses of semiconductor lasers. Β© 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 992β995, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23278
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