Averaging system for measurement of semiconductor lasers and LEDs optical response

✍ Scribed by M. Kot

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 229 KB
• Volume: 73
• Category: Article
• ISSN: 0010-4655
• DOI: 10.1016/0010-4655(92)90043-x

✦ Synopsis

This contribution deals with a special averaging system which was designed to improve the signal-to-noise ratio of the detected optical response of semiconductor light sources. The described device is an all-hardware system performing the averaging by using constant coefficients. The device communicates with the computer via a parallel interface. The device can cooperate with a sampling oscilloscope and in this way the signals in nanosecond and subnanosecond time domains can be studied. The maximum improvement of the signal-to-noise ratio of the signal after averaging process in comparison with the original signal is better than 55. The maximum speed without the sampling oscilloscope is better than 80 ksainples/s.