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Substrate temperature dependence of properties of ZnO thin films deposited by LP-MOCVD

✍ Scribed by J.D. Ye; S.L. Gu; S.M. Zhu; F. Qin; L.Q. Hu; L. Ren; R. Zhang; Y. Shi; Y.D. Zheng

No coin nor oath required. For personal study only.

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