Substrate Integrated Waveguide Cavity Resonators for Complex Permittivity Characterization of Materials
β Scribed by Saeed, K.; Pollard, R.D.; Hunter, I.C.
- Book ID
- 114660928
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 793 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9480
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π SIMILAR VOLUMES
## Abstract An investigation has been made on the quality factor of substrateβintegrated waveguide (SIW) resonance cavity. The ohmic losses at the sidewalls, front/end walls, and top/bottom planes of the SIW resonance cavity are derived, respectively, resulting in the quality factor formula of the
## Abstract An improved TE~01n~ resonantβcavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. Β© 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274β277, 2004; Published online in Wiley