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Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies

✍ Scribed by H. Puchner; Y.-C. Liu; W. Kong; F. Duan; R. Castagnetti

Book ID: 108361874
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 514 KB
Volume: 41
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(01)00207-4

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