Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures

✍ Scribed by P.L. Bonanno; S. Gautier; A.A. Sirenko; A. Kazimirov; Z.-H. Cai; W.H. Goh; J. Martin; A. Martinez; T. Moudakir; N. Maloufi; M.B. Assouar; A. Ramdane; L. Le Gratiet; A. Ougazzaden

• Book ID: 103863638
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 371 KB
• Volume: 268
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2009.09.016