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Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate

✍ Scribed by Sentenac, Anne; Belkebir, Kamal; Giovannini, Hugues; Chaumet, Patrick C.


Book ID
115430415
Publisher
Optical Society of America
Year
2008
Tongue
English
Weight
180 KB
Volume
33
Category
Article
ISSN
0146-9592

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## Abstract In modern fluorescence microscopy, lasers are a widely used source of light, both for imaging in total internal reflection and epi‐illumination modes. In wide‐field imaging, scattering of highly coherent laser light due to imperfections in the light path typically leads to nonuniform il