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Studying the resolving power of nanosized profiling using focused ion beams

✍ Scribed by Ageev, O. A.; Alekseev, A. M.; Vnukova, A. V.; Gromov, A. L.; Kolomiytsev, A. S.; Konoplev, B. G.; Lisitsyn, S. A.

Book ID
121548692
Publisher
SP MAIK Nauka/Interperiodica
Year
2014
Tongue
English
Weight
877 KB
Volume
9
Category
Article
ISSN
1995-0780

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Spin-resolved magnetic studies of focused ion beam etched nano-sized magnetic structures
✍ Jian Li; Carl Rau πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 349 KB

Scanning ion microscopy with polarization analysis (SIMPA) is used to study the spin-resolved surface magnetic structure of nano-sized magnetic systems. SIMPA is utilized for in situ topographic and spin-resolved magnetic domain imaging as well as for focused ion beam (FIB) etching of desired struct