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Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy

✍ Scribed by M. D. Vilisova; V. P. Germogenov; O. Zh. Kaztaev; V. A. Novikov; I. V. Ponomarev; A. N. Titkov

Book ID: 111450702
Publisher: SP MAIK Nauka/Interperiodica
Year: 2010
Tongue: English
Weight: 170 KB
Volume: 36
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785010050147

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