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Study on the structural properties of a-Si1−xSnx: H films prepared by rf sputtering

✍ Scribed by Chen Guang-hua; Zhang Fang-qing; Zhang Nan-ping; He De-yan

Publisher: Elsevier Science
Year: 1985
Weight: 389 KB
Volume: 12
Category: Article
ISSN: 0165-1633
DOI: 10.1016/0165-1633(85)90040-1

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